Acknowledgments

NIST

This edition would not exist without the original NIST/SEMATECH e-Handbook of Statistical Methods, a public resource produced and maintained by the National Institute of Standards and Technology in collaboration with SEMATECH. See the “Copyright” appendix for NIST’s full statement on the use of its materials.

The acknowledgments below are reproduced from the original e-Handbook’s own Acknowledgements page, crediting everyone who built the source material this edition is based on.

Origins of the e-Handbook

The e-Handbook’s origins trace back to the work of Mary Natrella — see Origins of the e-Handbook in the Work of Mary Natrella for the full account.

Technical Editors

  • Carroll Croarkin — Statistical Engineering Division, Information Technology Laboratory, NIST
  • Paul Tobias — Statistical Methods Group, SEMATECH

Chapter Editors

  1. Exploratory Data Analysis:
    • James J. Filliben — Statistical Engineering Division, Information Technology Laboratory, NIST
  2. Measurement Process Characterization:
    • Carroll Croarkin — Statistical Engineering Division, Information Technology Laboratory, NIST
  3. Production Process Characterization:
    • Barry Hembree — AMD
  4. Process Modeling:
    • William Guthrie — Statistical Engineering Division, Information Technology Laboratory, NIST
  5. Process Improvement:
    • Paul Tobias — Statistical Methods Group, SEMATECH
    • Ledi Trutna — Advanced Micro Devices
  6. Process or Product Monitoring and Control:
    • Jack Prins — Statistical Methods Group, SEMATECH
  7. Product and Process Comparisons:
    • Jack Prins — Statistical Methods Group, SEMATECH
  8. Assessing Product Reliability:
    • Paul Tobias — Statistical Methods Group, SEMATECH

Project Coordinator

  • Chelli Zey — Statistical Methods Group, SEMATECH

Chapter Authors

  1. Exploratory Data Analysis:
    • James J. Filliben — Statistical Engineering Division, Information Technology Laboratory, NIST
    • Alan Heckert — Statistical Engineering Division, Information Technology Laboratory, NIST
  2. Measurement Process Characterization:
    • Carroll Croarkin — Statistical Engineering Division, Information Technology Laboratory, NIST
  3. Production Process Characterization:
    • Barry Hembree — AMD
  4. Process Modeling:
    • William Guthrie — Statistical Engineering Division, Information Technology Laboratory, NIST
    • James Filliben — Statistical Engineering Division, Information Technology Laboratory, NIST
    • Alan Heckert — Statistical Engineering Division, Information Technology Laboratory, NIST
  5. Process Improvement:
    • Ledi Trutna — Advanced Micro Devices
    • Pat Spagon — Motorola University
    • Dr. Enrique del Castillo — Department of Industrial & Manufacturing Engineering, Pennsylvania State University
    • Terri Moore — Motorola
    • Sam Hartley — Motorola
    • Arnon Hurwitz — QualTech Motorola
  6. Process or Product Monitoring and Control:
    • Jack Prins — Statistical Methods Group, SEMATECH
  7. Product and Process Comparisons:
    • Jack Prins — Statistical Methods Group, SEMATECH
    • Don McCormack — Statistical Methods Group, SEMATECH
    • Di Michelson — Statistical Methods Group, SEMATECH
    • Karen Horrell — Statistical Methods Group, SEMATECH
  8. Assessing Product Reliability:
    • Paul Tobias — Statistical Methods Group, SEMATECH

Review and Management Contributors

  • Tom Ryan — NIST: external staff
  • Keith Eberhardt — Statistical Engineering Division, Information Technology Laboratory, NIST
  • Dom Vecchia — Statistical Engineering Division, Information Technology Laboratory, NIST
  • Nien-Fan Zhang — Statistical Engineering Division, Information Technology Laboratory, NIST
  • Jolene Splett — Statistical Engineering Division, Information Technology Laboratory, NIST
  • Jack Wang — Statistical Engineering Division, Information Technology Laboratory, NIST
  • David Banks — Statistical Engineering Division, Information Technology Laboratory, NIST
  • Mark Levenson — Statistical Engineering Division, Information Technology Laboratory, NIST

HTML Developers/Coders

  • Alan Heckert — Statistical Engineering Division, Information Technology Laboratory, NIST
  • Cesar Iriarte — Iris Visual Design
  • George Kaupas — AMD
  • Mark Reeder — Statistical Engineering Division, Information Technology Laboratory, NIST
  • Chelli Zey — Statistical Methods Group, SEMATECH

Graphic Artist

  • Cesar Iriarte — Iris Visual Design

Dataplot Developers

  • James J. Filliben — Statistical Engineering Division, Information Technology Laboratory, NIST
  • Alan Heckert — Statistical Engineering Division, Information Technology Laboratory, NIST
  • Robert Lipman — Building and Fire Research Laboratory, NIST

Case Study Contributors

R Code Contributors

  • Ivelisse Aviles
  • Charline Cleraux
  • Francesca Pennecchi
  • Jolene Splett — Statistical Engineering Division, Information Technology Laboratory, NIST
  • James Yen — Statistical Engineering Division, Information Technology Laboratory, NIST
  • Jack Wang — Technical Editor, Statistical Engineering Division, Information Technology Laboratory, NIST
  • Antonio Possolo — Project Leader, Technical Editor, Statistical Engineering Division, Information Technology Laboratory, NIST

This work was supported in part by the High Performance Computing and Communications/Systems Integration for Manufacturing Applications (HPCC/SIMA).