This is the data file   OHM100.DAT
Source: This example is used on page mpc441.htm of the e-Handbook
        to demonstrate an optimization design.  Data is from Carroll
        Croarkin.

Description:  This data is a subset of data collected in a nested design
              for one check standard (#140) and one probe (#2362).  The
              measurements are resistivity (ohm.cm) readings with six
              repetitions per day. The individual level-1
              standard deviations from the six repetitions and degrees
              of freedom are recorded in the last two columns of the
              database. 


To read into Dataplot, enter

    SKIP 25
    READ MPC441.DAT RUN WAFER PROBE MONTH DAY OPER TEMP AVERAGE STDDEV DF





Run  Wafer  Probe  Month  Day  Op  Temp    Average  Stddev  df
--------------------------------------------------------------
 1    140    2362    3    15   1   23.08   96.0771  0.1024  5
 1    140    2362    3    17   1   23.00   95.9976  0.0943  5
 1    140    2362    3    18   1   23.01   96.0148  0.0622  5
 1    140    2362    3    22   1   23.27   96.0397  0.0702  5
 1    140    2362    3    23   2   23.24   96.0407  0.0627  5
 1    140    2362    3    24   2   23.13   96.0445  0.0622  5
 2    140    2362    4    12   1   22.88   96.0793  0.0996  5
 2    140    2362    4    18   2   22.76   96.1115  0.0533  5
 2    140    2362    4    19   2   22.79   96.0803  0.0364  5
 2    140    2362    4    19   1   22.71   96.0411  0.0768  5
 2    140    2362    4    20   2   22.84   96.0988  0.1042  5
 2    140    2362    4    21   1   22.94   96.0482  0.0868  5